DocumentCode :
3451852
Title :
A Structure-independent Approach for Fault Detection Hardware Implementations of the Advanced Encryption Standard
Author :
Mozaffari-Kermani, Mehran ; Reyhani-Masoleh, Arash
Author_Institution :
Univ. of Western Ontario, London
fYear :
2007
fDate :
10-10 Sept. 2007
Firstpage :
47
Lastpage :
53
Abstract :
The Advanced Encryption Standard, which is used extensively for secure communications, has been accepted recently as a symmetric cryptography standard. However, occurrence of the internal faults by intrusion of the attackers may cause confidential information leak to reveal the secret key. For this reason, several schemes for fault detection of the transformations and rounds in the encryption and decryption of the Advanced Encryption Standard are proposed. In this paper, we present a structure-independent fault detection scheme for the Advanced Encryption Standard. The proposed scheme is independent of the way S- box (inverse S-box) is constructed and can be used for both encryption and decryption. It can be applied to both the S-boxes (and inverse S-boxes) using look-up tables as well as those utilizing logic gate implementations based on composite fields. We have obtained the formulations for the fault detection of the SubBytes (inverse SubBytes) using the relation between the input and output of the S-box (inverse S-box). Then, we have proposed and simulated a signature-based structure-independent fault detection scheme. Moreover, the FPGA implementations of the original and the proposed schemes as well as their overhead are presented.
Keywords :
cryptography; digital signatures; fault diagnosis; field programmable gate arrays; logic gates; table lookup; FPGA implementation; advanced encryption standard; inverse S-box; logic gate implementation; look-up table; secure communication; signature-based structure-independent fault detection; symmetric cryptography standard; Communication standards; Cryptography; Delay; Electrical fault detection; Fault detection; Fault diagnosis; Hardware; Logic gates; NIST; Table lookup; Advanced encryption standard; S-box.; fault detection; finite field;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault Diagnosis and Tolerance in Cryptography, 2007. FDTC 2007. Workshop on
Conference_Location :
Vienna
Print_ISBN :
978-0-7695-2982-0
Type :
conf
DOI :
10.1109/FDTC.2007.15
Filename :
4318984
Link To Document :
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