DocumentCode
3451925
Title
Effect of thickness ratio on vibrations of an asymmetric bimorph plate of piezoelectric ceramics
Author
Lee, P.C.Y. ; Liu, N.H.
Author_Institution
Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
fYear
1998
fDate
27-29 May 1998
Firstpage
891
Lastpage
899
Abstract
An asymmetric bimorph plate is formed by inverting the polarization of two piezoelectric ceramic plates of unequal thickness (b 1 and b2, respectively) and bonding them together. The thickness ratio of the two layers is defined by rt=b2/b1. Exact and close form solutions of the 3-D equations of linear piezoelectricity are obtained for the free vibrations of an infinite, asymmetric bimorph plate of piezoelectric ceramics. These solutions which satisfy the traction-free and electrically shorted face conditions and the continuity conditions of mechanical displacements, tractions, normal electrical displacements and potential at the interface of the two layers. They reduce to those of a homogeneous plate as rt=0 and to those of a symmetric bimorph plate as rt=1. Dispersion curves are computed and plotted for real as well as imaginary wave numbers for piezoelectric ceramic bimorphs with various thickness ratios. The effects of changes in thickness ratios on the behavior of various frequency branches are examined in detail
Keywords
piezoceramics; piezoelectricity; vibrational modes; 3D equations; asymmetric bimorph plate; continuity conditions; dispersion curves; electrical displacements; electrically shorted face conditions; free vibrations; frequency branches; homogeneous plate; imaginary wave numbers; infinite asymmetric bimorph plate; linear piezoelectricity; mechanical displacements; piezoelectric ceramic plates; thickness ratio; thickness ratios; traction-free; tractions; unequal thickness; vibrations; Bonding; Capacitive sensors; Ceramics; Civil engineering; Electrodes; Equations; Operations research; Piezoelectric polarization; Piezoelectricity; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location
Pasadena, CA
ISSN
1075-6787
Print_ISBN
0-7803-4373-5
Type
conf
DOI
10.1109/FREQ.1998.718005
Filename
718005
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