Title :
Register Transfer Level Concurrent Error Detection in Elliptic Curve Crypto Implementations
Author :
Stern, Richard ; Joshi, Nikhil ; Wu, Kaijie ; Karri, Ramesh
Author_Institution :
L3 Commun., Brooklyn
Abstract :
In this paper we present an register transfer level (RTL) concurrent error detection (CED) technique targeting hardware implementations of elliptic curve cryptography (ECC). The proposed mixed hardware- and time-redundancy based CED techniques use the mathematical properties of the underlying Galois field as well as the ECC primitives to detect both soft errors and permanent faults with low area overhead. Results for sequential implementations of GF multiplication and inverse operations yielded an area overhead of 30% and a time overhead of 120%.
Keywords :
cryptography; Galois field; elliptic curve crypto implementations; elliptic curve cryptography; mixed hardware techniques; register transfer level concurrent error detection; time-redundancy based CED techniques; Circuit faults; Elliptic curve cryptography; Elliptic curves; Fault detection; Frequency; Hardware; Public key cryptography; Redundancy; Single event transient; Single event upset;
Conference_Titel :
Fault Diagnosis and Tolerance in Cryptography, 2007. FDTC 2007. Workshop on
Conference_Location :
Vienna
Print_ISBN :
978-0-7695-2982-0
DOI :
10.1109/FDTC.2007.17