Title :
Vibrations and static responses of asymmetric bimorph disks of piezoelectric ceramics
Author :
Lee, P.C.Y. ; Huang, R. ; Li, X. ; Shih, W.-H.
Author_Institution :
Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
Abstract :
In an earlier article, the flexural vibrations in bimorph disks and extensional vibrations in homogeneous disks of piezoelectric ceramics were studied. In the present paper, the coupled flexural and extensional vibrations and static responses in an asymmetric bimorph disk, which is formed by bonding together two piezoelectric ceramic disks of unequal thickness and opposite polarization, are investigated. Governing equations of coupled motions for asymmetric bimorphs are deduced from the recently derived two-dimensional first-order equations for piezoelectric crystal plates with thickness-graded material properties. Then, closed form solutions of these equations for circular disks are obtained for free vibrations, piezoelectrically forced vibrations and responses under static voltage difference. Resonance frequencies, distribution of displacements and surface charges, impedance and static responses are calculated for asymmetric bimorph disks of various thickness ratios and diameter-to-thickness ratios. Experimental data on resonances and impedance are obtained for asymmetric bimorph disks of PZT-857 for two different thickness ratios. Comparisons of predicted and measured results show that the agreements are close
Keywords :
dielectric resonance; lead compounds; piezoceramics; vibrations; PZT; PZT-857; PbZrO3TiO3; asymmetric bimorph disk; asymmetric bimorph disks; bonding; closed form solutions; coupled flexural vibrations; coupled motions; extensional vibrations; flexural vibrations; free vibrations; homogeneous disks; piezoelectric ceramic disks; piezoelectric ceramics; piezoelectrically forced vibrations; resonance frequencies; static response; static responses; vibrations; Bonding; Ceramics; Closed-form solution; Difference equations; Material properties; Piezoelectric polarization; Resonance; Resonant frequency; Surface impedance; Voltage;
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA
Print_ISBN :
0-7803-4373-5
DOI :
10.1109/FREQ.1998.718006