DocumentCode :
3452360
Title :
Multiplexing and M# measurement in spectral hole burning medium
Author :
Zhiwen Liu ; Wenhai Liu ; Moser, C. ; Zhang, D. ; Solornatine, I.V. ; Psaltis, D. ; Gorokhovsky, A.
Author_Institution :
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
fYear :
2001
fDate :
11-11 May 2001
Firstpage :
374
Abstract :
Summary form only given Spectral hole burning holography can store both the temporal and spatial information. In cryogenic temperature, only a certain group of atoms in the spectral hole burning material can interact with the incident photons of specific frequency. It allows an extra degree of freedom to store and access information, i.e. the frequency domain. 12,000 holograms at a single location by frequency multiplexing has been demonstrated. The storage capacity can be further increased by combining angle and frequency multiplexing. A system measure of the hologram diffraction efficiency obtainable by multiplexing M holograms at a single location and frequency is given by the M/#. In the paper we report the measurement of M/# in a 400 /spl mu/m thick sample of H/sub 2/TBNP in polyvinyl butyral (PVB) with a concentration of 3 /spl times/ 10/sup -5/ mol/l.
Keywords :
holographic storage; multiplexing; optical hole burning; optical materials; optical saturable absorption; organic compounds; 400 micron; H/sub 2/TBNP; M holograms; M# measurement; M/#; angle multiplexing; cryogenic temperature; degree of freedom; frequency domain; frequency multiplexing; hologram diffraction efficiency; incident photons; information access; information storage; multiplexing; polyvinyl butyral; spatial information; spectral hole burning holography; spectral hole burning material; spectral hole burning medium; storage capacity; temporal information; thick sample; Bleaching; Diffraction; Frequency measurement; Holography; Iris; Lenses; Optical materials; Optical scattering; Thickness measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
Type :
conf
DOI :
10.1109/CLEO.2001.947937
Filename :
947937
Link To Document :
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