DocumentCode :
3452365
Title :
Using fault injection to assess software engineering standards
Author :
Voas, Jeffrey M. ; Miller, Keith W.
Author_Institution :
Reliable Software Technol. Corp., Sterling, VA, USA
fYear :
1995
fDate :
21-25 Aug 1995
Firstpage :
139
Lastpage :
145
Abstract :
Standards for quality software are increasingly important, especially for critical systems. Development standards and practices must be subjected to quantitative analyses; it is no longer adequate to encourage practices because they “make sense” or “seem reasonable.” Process improvement must be demonstrated by a history of improved products. Fault-injection methods can be used to assess the quality of software itself and to demonstrate the effectiveness of software processes. Fault-injection techniques can help developers move beyond the practical limitations of testing. Fault-injection techniques focus on software behavior, not structure; process-oriented techniques cannot measure behavior as precisely. Fault-injection methods are dynamic, empirical, and tractable; as such, they belie the notion that measuring the reliability of critical software is futile. Before focusing too narrowly on the assessment of software development processes, we should further explore the measurement of software behaviors
Keywords :
program debugging; program testing; safety-critical software; software quality; software reliability; software standards; critical systems; fault injection; process-oriented techniques; software behavior; software development processes; software engineering standards assessment; software measurement; software process improvement; software reliability; testing; Pervasive computing; Software engineering; Software measurement; Software quality; Software safety; Software standards; Software testing; Standards development; Standards organizations; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Standards Symposium, 1995. (ISESS'95) 'Experience and Practice', Proceedings., Second IEEE International
Conference_Location :
Montreal, Que.
ISSN :
1082-3670
Print_ISBN :
0-8186-7137-8
Type :
conf
DOI :
10.1109/SESS.1995.525959
Filename :
525959
Link To Document :
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