Title :
Frequency diversity ultrasonic flaw detection using order statistic filters
Author :
Saniie, J. ; Donohue, K.D. ; Nagle, D.T. ; Bilgutay, N.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
The authors present the theory and application of order statistic (OS) filters in ultrasonic flaw detection problems. The theory suggests that the optimal rank can be founded upon the knowledge of the distribution of flaws and grains. Experimental and simulation results for the OS filters are presented for flaws embedded in steel specimens. OS filters and averaging algorithms are compared with regard to their application for flaw detection. It is shown that OS filters can improve the flaw-to-clutter echo ratio better than averaging algorithms for a broader class of clutter and flaw echo statistics
Keywords :
acoustic signal processing; flaw detection; ultrasonic materials testing; acoustic signal processing; averaging algorithms; flaw-to-clutter echo ratio; frequency diversity; grains; order statistic filters; ultrasonic flaw detection; Clutter; Filters; Frequency diversity; Narrowband; Radar detection; Radar scattering; Rayleigh scattering; Signal processing algorithms; Statistics; Ultrasonic imaging;
Conference_Titel :
Ultrasonics Symposium, 1988. Proceedings., IEEE 1988
Conference_Location :
Chicago, IL
DOI :
10.1109/ULTSYM.1988.49502