Title :
Measurement and simulation results of Ti coated microwave absorber
Author :
Sun, Ding ; McGinnis, David
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
Abstract :
Microwave absorbers are coated with resistive thin films. S parameters are measured before and after coating. The measured data are used to check the simulation results of software HFSS which are in good agreement with the measurement results
Keywords :
S-parameters; beam handling equipment; electromagnetic wave absorption; metallic thin films; titanium; HFSS; S parameters; Ti; Ti coated microwave absorber; resistive thin films; Coatings; Electrical resistance measurement; Ferrites; Microwave measurements; Permeability measurement; Permittivity measurement; Software measurement; Sputtering; Surface resistance; Transistors;
Conference_Titel :
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5573-3
DOI :
10.1109/PAC.1999.795378
