Title :
RF pulsed tests on 3 GHz niobium cavities
Author :
Le Duff, J. ; Thomas, C. ; Bienvenu, G. ; Sun, H. ; Fouaidy, M. ; Parodi, R.
Author_Institution :
LAL, Orsay, France
Abstract :
The achievable limiting RF field for S-Band and L-Band superconducting cavities is still an open question today. Previous studies on Sn and In have shown that a surface magnetic field Bs higher than the thermodynamical critical field Bc might be reached. The ultimate limiting field is then the superheating field Bsh (Bsh=240 mT or Eacc=60 MV/m for Nb at T=0 K). However, the maximum accelerating field observed so far is in the range Eacc=37-40 MV/m for the best 1.3 GHz Nb cavities. A dedicated facility (NEPAL Supra Test Facility) is currently used at LAL for measuring Bsh on bulk Nb 3 GHz cavities supplied by INFN-Genova. High power pulses (4.5 μs, up to 5 MW) are used to reach Bsh before cavity thermal breakdown occurs. A method for analyzing the response of a SRF cavity when subjected to pulsed high RF power was developed and the corresponding numerical simulation results were validated by comparison to experimental data. This technique is successfully applied to detect Eacc and B sh at which the cavity magnetic breakdown occurs. Magnetic penetration depth (λ) measurements were also performed with a low RF level test bed and the corresponding data analyzed then compared to theoretical predictions
Keywords :
accelerator cavities; niobium; penetration depth (superconductivity); superconducting cavity resonators; 3 GHz niobium cavities; L-band superconducting cavities; NEPAL Supra Test Facility; Nb; RF pulsed tests; S-band superconducting cavities; SRF cavity; cavity thermal breakdown; magnetic penetration depth; maximum accelerating field; superheating field; thermodynamical critical field; Acceleration; Electric breakdown; L-band; Magnetic fields; Niobium; Radio frequency; Superconducting magnets; Test facilities; Testing; Tin;
Conference_Titel :
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5573-3
DOI :
10.1109/PAC.1999.795398