Title :
The new Shielded Bitline Sensing Method for FC-SGT Flash memory
Author :
Yamakawa, Y. ; Nakamura, H. ; Masuoka, F.
Author_Institution :
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan. Phone & Fax: +81 222175486, Email: yamakawa@masuoka.riec.tohoku.ac.jp
Keywords :
Capacitance; Circuit noise; Coupling circuits; Equivalent circuits; Flash memory; Flash memory cells; Noise reduction; Nonvolatile memory; Shape control; Voltage;
Conference_Titel :
Device Research Conference, 2006 64th
Conference_Location :
State College, PA, USA
Print_ISBN :
0-7803-9748-7
DOI :
10.1109/DRC.2006.305116
