Title :
A novel cross-correlation spectroscopy in sub-THz region using incoherent light source
Author :
Morikawa, O. ; Tonouchi, M. ; Hangyo, M.
Author_Institution :
Res. Center for Supercond. Mater. & Electron., Osaka Univ., Japan
fDate :
Aug. 30 1999-Sept. 3 1999
Abstract :
We proposed a novel sub-THz spectroscopic system using a multimode laser diode, and successfully demonstrated the refractive index measurement of Si wafers.
Keywords :
measurement by laser beam; optical correlation; refractive index measurement; semiconductor lasers; silicon; submillimetre wave spectra; submillimetre wave spectroscopy; Si; Si wafers; cross-correlation spectroscopy; incoherent light source; multimode laser diode; refractive index measurement; sub-THz region spectra; sub-THz spectroscopic system; Delay effects; Diode lasers; Frequency; Laser beams; Light sources; Photoconductivity; Radiation detectors; Spectroscopy; Ultrafast electronics; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on
Conference_Location :
Seoul, South Korea
Print_ISBN :
0-7803-5661-6
DOI :
10.1109/CLEOPR.1999.814764
