DocumentCode :
3452949
Title :
Fabrication of 945 MHz Band Film Surface Acoustic Wave Resonators Using ZnO Thin Film with Si Substrate
Author :
Ntagwirumugara, E. ; Gryba, T. ; Zhang, V. ; Carlier, J. ; Lefebvre, J.E.
Author_Institution :
Inst. d´´Electron. de Microelectron. et de Nanotechnol., Valenciennes
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
176
Lastpage :
180
Abstract :
This paper, we present the analysis of a ladder-type filter, in the frequency band of 945 MHz, developed on a structure with two layers of a ZnO film on a Silicon substrate with aluminum (AT) IDTs using coupling of modes (COM) theory. The case of a layer ZnO deposited on a not-piezoelectric substrate, [111]-[110]-Si is examined. Although silicon is no piezoelectric, the configuration gives for the modes of surface of a higher order, the coupling coefficients K2 of about 5.5% (quite higher than the maximum value obtained for ZnO alone 1%) with the metallization coefficient of 0.5. We presents the optimization of the characteristics SAW, in particular by the choice of:-the thickness of the piezoelectric layer,-localization of IDTs,-the metallization or not of surface or interface,-crystalline orientation of the substrate and propagation direction, -the thickness of the fingers of IDT. The transfer function of SAW ladder type filter resonators (6 resonators) is presented, analyzed and compared with the experimental results. This frequency response confirms that it is possible to integrate on Si substrate the filters use for GSM and DECT systems.
Keywords :
II-VI semiconductors; UHF filters; elemental semiconductors; ladder filters; silicon; surface acoustic wave resonator filters; thin film devices; zinc compounds; SAW; SAW ladder; Si; ZnO; coupling coefficients K2; coupling of modes; film surface acoustic wave resonators; filter resonators; frequency 945 MHz; metallization coefficient; piezoelectric layer; silicon substrate; thin film; Acoustic waves; Fabrication; Metallization; Resonator filters; Semiconductor films; Semiconductor thin films; Silicon; Substrates; Surface acoustic waves; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location :
Geneva
ISSN :
1075-6787
Print_ISBN :
978-1-4244-0646-3
Electronic_ISBN :
1075-6787
Type :
conf
DOI :
10.1109/FREQ.2007.4319058
Filename :
4319058
Link To Document :
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