Title :
Simple energy level model for frequency degradation of USO under radiation
Author :
Carlotti, J.F. ; Boy, J.J. ; Cibiel, G. ; Inguimbert, C.
Author_Institution :
Inst. Femto-ST, Besancon
fDate :
May 29 2007-June 1 2007
Abstract :
Space radiations are responsible of transient and permanent shifts of the output frequency signal of any quartz crystal oscillator. In this paper, the degradation of quartz crystals under radiation stresses is shown to be related to competition between trapping and recombination of radiation-induced carriers in quartz lattice. The presented model exhibits a good agreement with experimental data.
Keywords :
circuit stability; crystal oscillators; frequency response; radiation effects; satellite communication; stress effects; USO frequency degradation; carriers trapping; energy level model; permanent frequency shifts; quartz crystal oscillator; quartz lattice; radiation stresses; radiation-induced carriers recombination; space radiations; transient frequency shifts; ultra stable oscillators; Degradation; Energy states; Frequency;
Conference_Titel :
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location :
Geneva
Print_ISBN :
978-1-4244-0646-3
Electronic_ISBN :
1075-6787
DOI :
10.1109/FREQ.2007.4319060
