DocumentCode :
3453164
Title :
Experimental evaluation of arrayed microcolumn with a monolithic structure
Author :
Jeong, J.W. ; Kim, D.J. ; Kim, H.S. ; Choi, S.K. ; Kim, D.Y.
fYear :
2004
fDate :
Oct. 27-29, 2004
Firstpage :
110
Lastpage :
111
Keywords :
Assembly; Electron beams; Electron emission; Lenses; Lithography; Microoptics; Moon; Optical microscopy; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN :
4-99024720-5
Type :
conf
DOI :
10.1109/IMNC.2004.245748
Filename :
1459498
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3453164