Intermodulation Crosstalk Characteristics of WDM Silicon Microring Modulators

Author

Padmaraju, Kishore ; Xiaoliang Zhu ; Long Chen ; Lipson, Michal ; Bergman, Keren

Author_Institution

Dept. of Electr. Eng., Columbia Univ., New York, NY, USA

Volume

26

Issue

14

fYear

2014

fDate

July15, 15 2014

Firstpage

1478

Lastpage

1481

Abstract

We elaborate on and experimentally characterize the intermodulation crosstalk properties of a 10-Gb/s silicon microring modulator. Bit-error-rate measurements and eye diagrams are used to discern the degradation in signal quality due to intermodulation crosstalk. Evaluation of the power penalties with varying channel spacing are used to support wavelength-division-multiplexed cascaded microring modulator channel spacings as dense as 100 GHz with negligible expected intermodulation crosstalk.

Keywords

elemental semiconductors; intermodulation; intersymbol interference; micromechanical devices; optical crosstalk; optical interconnections; optical modulation; silicon; wavelength division multiplexing; Si; WDM silicon microring modulators; bit-error-rate; channel spacing; eye diagrams; intermodulation crosstalk characteristics; optical interconnects; power penalties; signal quality; wavelength-division-multiplexed cascaded microring modulator; Bit error rate; Channel spacing; Crosstalk; Modulation; Optical crosstalk; Silicon; Wavelength division multiplexing; Intersymbol interference; microring modulator; optical modulation; wavelength division multiplexing;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2014.2326621

Filename

6824827