• DocumentCode
    3453435
  • Title

    Performance of the optimum noise source reflection coefficient (Γ0) vs. temperature in microwave HEMTs by model analysis

  • Author

    Caddemi, Alina ; Prima, F. Di ; Sannino, M.

  • Author_Institution
    Dipartimento di Ingegneria Elettrica, Palermo Univ., Italy
  • fYear
    1995
  • fDate
    11-14 Oct 1995
  • Firstpage
    499
  • Lastpage
    502
  • Abstract
    In the present paper we exploit the results of the characterization and modeling vs. frequency (2-18 GHz) and temperature (-50-20°C) of a series of pseudomorphic HEMTs to carry out an investigation on the noise parameter. We had previously observed from the characterization of several HEMT series at room temperature, that a close relationship exists between the optimum input termination reflection coefficient Γ0 and the scattering parameter S11 and it always occurred that |S11|>|Γ 0| over the frequency range given above. We here analyze the performance of |Γ0| at lower temperatures and use the equivalent circuit model to explore the cause of its variations with respect to its behavior at 20°C
  • Keywords
    S-parameters; equivalent circuits; high electron mobility transistors; microwave field effect transistors; semiconductor device noise; 2 to 18 GHz; 20 to 50 C; PHEMT; characterization; equivalent circuit model; frequency; microwave HEMTs; model analysis; noise parameter; optimum noise source reflection coefficient; pseudomorphic HEMTs; scattering parameter; temperature; Acoustic reflection; Circuit noise; Equations; Equivalent circuits; HEMTs; Microwave frequencies; Noise figure; Scattering parameters; Space technology; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1995. CAS'95 Proceedings., 1995 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-2647-4
  • Type

    conf

  • DOI
    10.1109/SMICND.1995.495069
  • Filename
    495069