• DocumentCode
    3453709
  • Title

    Three-dimensional analysis for rectangular AT-cut quartz plates with bi-mesa structure

  • Author

    Sekimoto, Hitoshi ; Goka, Shigeyoshi ; Watanabe, Yasuaki

  • Author_Institution
    Tokyo Metropolitan Univ., Japan
  • fYear
    1998
  • fDate
    27-29 May 1998
  • Firstpage
    964
  • Lastpage
    967
  • Abstract
    This paper describes a method to analyze 3-D vibrations of rectangular AT-cut quartz plates with bi-mesa structure. The method is based on a classical approach. As in the 2-D analysis of the previous paper, the displacement field for each of thick and thin portions of a plate is represented by a linear combination of guided waves. In the 3-D analysis we apply the 2-D finite element method (FEM) to obtain the waves guided by two pairs of parallel surfaces. We also incorporate a new expression for orthogonality relation of guided waves into the continuity condition of displacement and stress over part of a junction cross section. A computational advantage of this method is that it can greatly reduce matrix size compared with the 3-D FEM. As an example of calculation, the frequency spectrum for an X elongated plate of bi-mesa shape is presented along with one for a flat plate
  • Keywords
    crystal resonators; finite element analysis; modal analysis; piezoelectric oscillations; vibrations; 2-D finite element method; 3-D vibrations analysis; X elongated plate; bi-mesa structure; boundary conditions; continuity condition; displacement field; flat plate; frequency spectrum; junction cross section; linear combination of guided waves; method of weighted residuals; mode expansion; orthogonality relation; pairs of parallel surfaces; rectangular AT-cut quartz plates; reduced matrix size; thick portions; thin portions; Boundary conditions; Electrodes; Optical wavelength conversion; Performance analysis; Resonant frequency; Shape; Stress; Strips; Surface waves; Two dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
  • Conference_Location
    Pasadena, CA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-4373-5
  • Type

    conf

  • DOI
    10.1109/FREQ.1998.718016
  • Filename
    718016