DocumentCode :
3453740
Title :
Extraction of Accumulation Mobility from C-V Characteristics of Pentacene MIS Structures
Author :
Jung, Keum-Dong ; Lee, Cheon An ; Park, Dong-Wook ; Park, Byung-Gook ; Shin, Hyungcheol ; Lee, Jong Duk
Author_Institution :
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea. Tel: +82-2-880-7282, Fax: +82-2-882-4658, e-mail: windbit@naver.com
fYear :
2006
fDate :
26-28 June 2006
Firstpage :
139
Lastpage :
140
Keywords :
Capacitance; Capacitance-voltage characteristics; Electrical resistance measurement; Equations; Frequency measurement; Insulation; OFETs; Pentacene; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2006 64th
Conference_Location :
State College, PA, USA
ISSN :
1548-3770
Print_ISBN :
0-7803-9748-7
Type :
conf
DOI :
10.1109/DRC.2006.305157
Filename :
4097574
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3453740
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