• DocumentCode
    3453770
  • Title

    Simulation of low-energy ion implantation process by atomistic modeling

  • Author

    Kwon, Oh-Seob ; Seo, Ji-Hyun ; Yoo, Jae-Hyun ; Kim, Ki-Dong ; Lee, Jun-Gu ; Park, Il-Soo ; Won, Tae-young

  • fYear
    2004
  • fDate
    Oct. 27-29, 2004
  • Firstpage
    148
  • Lastpage
    149
  • Keywords
    Annealing; Computational modeling; Impurities; Ion implantation; Kinetic theory; Monte Carlo methods; Nanoscale devices; Semiconductor process modeling; Silicon; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
  • Print_ISBN
    4-99024720-5
  • Type

    conf

  • DOI
    10.1109/IMNC.2004.245767
  • Filename
    1459517