DocumentCode :
3453882
Title :
Current measurement of mechanically stretched nanowire with transmission electron microscope direct observation
Author :
Ishida, Tadashi ; Kakushima, Kuniyuki ; Fujita, Hiroyuki
fYear :
2004
fDate :
Oct. 27-29, 2004
Firstpage :
154
Lastpage :
155
Keywords :
Bonding; Bridge circuits; Current measurement; Electrodes; Etching; Microactuators; Scanning electron microscopy; Scanning probe microscopy; Transmission electron microscopy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN :
4-99024720-5
Type :
conf
DOI :
10.1109/IMNC.2004.245770
Filename :
1459520
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3453882
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