• DocumentCode
    3453882
  • Title

    Current measurement of mechanically stretched nanowire with transmission electron microscope direct observation

  • Author

    Ishida, Tadashi ; Kakushima, Kuniyuki ; Fujita, Hiroyuki

  • fYear
    2004
  • fDate
    Oct. 27-29, 2004
  • Firstpage
    154
  • Lastpage
    155
  • Keywords
    Bonding; Bridge circuits; Current measurement; Electrodes; Etching; Microactuators; Scanning electron microscopy; Scanning probe microscopy; Transmission electron microscopy; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
  • Print_ISBN
    4-99024720-5
  • Type

    conf

  • DOI
    10.1109/IMNC.2004.245770
  • Filename
    1459520
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3453882