DocumentCode :
3453985
Title :
Atomistic investigations of alpha-Fe thin film growth on Al [100]
Author :
Chung, Chan-Yeup ; Lee, Sungho ; Chung, Yong-Chae
fYear :
2004
fDate :
Oct. 27-29, 2004
Firstpage :
162
Lastpage :
163
Keywords :
Artificial intelligence; Atomic layer deposition; Atomic measurements; Iron; Magnetic films; Magnetic multilayers; Resource description framework; Substrates; Surface morphology; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN :
4-99024720-5
Type :
conf
DOI :
10.1109/IMNC.2004.245774
Filename :
1459524
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3453985
بازگشت