DocumentCode
3453985
Title
Atomistic investigations of alpha-Fe thin film growth on Al [100]
Author
Chung, Chan-Yeup ; Lee, Sungho ; Chung, Yong-Chae
fYear
2004
fDate
Oct. 27-29, 2004
Firstpage
162
Lastpage
163
Keywords
Artificial intelligence; Atomic layer deposition; Atomic measurements; Iron; Magnetic films; Magnetic multilayers; Resource description framework; Substrates; Surface morphology; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN
4-99024720-5
Type
conf
DOI
10.1109/IMNC.2004.245774
Filename
1459524
Link To Document