3454133

Characteristics of thermal treated quantum dot infrared photodetector

Hwang, Su Hwan ; Shin, J.C. ; Song, J.D. ; Choi, W.J. ; Lee, J.I. ; Han, H. ; Lee, Sang-Won ; Kwack, H.S. ; Cho, Y.H.

2004

Oct. 27-29, 2004

174

175

Carrier confinement; Dark current; Electrons; Infrared detectors; Photodetectors; Physics; Quantum dots; Thermal degradation; US Department of Transportation; Voltage;

English

ieee

Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International

4-99024720-5

conf

10.1109/IMNC.2004.245780

1459530