Abstract :
The following topics are dealt with: single event upset tolerances; reconfigurable logic; radiation experiments and analysis; circuit degradation; memories and 3D integration; secure hardware; soft error analysis and tolerance; and integrated circuit reliability.
Keywords :
integrated circuit reliability; logic circuits; radiation hardening (electronics); semiconductor storage; three-dimensional integrated circuits; 3D integration; circuit degradation; integrated circuit reliability; radiation experiments; reconfigurable logic; secure hardware; semiconductor memory; single event upset tolerance; soft error analysis;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
DOI :
10.1109/IOLTS.2012.6313831
