DocumentCode
3454169
Title
[Front matter]
fYear
2012
fDate
27-29 June 2012
Abstract
The following topics are dealt with: single event upset tolerances; reconfigurable logic; radiation experiments and analysis; circuit degradation; memories and 3D integration; secure hardware; soft error analysis and tolerance; and integrated circuit reliability.
Keywords
integrated circuit reliability; logic circuits; radiation hardening (electronics); semiconductor storage; three-dimensional integrated circuits; 3D integration; circuit degradation; integrated circuit reliability; radiation experiments; reconfigurable logic; secure hardware; semiconductor memory; single event upset tolerance; soft error analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location
Sitges
Print_ISBN
978-1-4673-2082-5
Type
conf
DOI
10.1109/IOLTS.2012.6313831
Filename
6313831
Link To Document