DocumentCode :
3454421
Title :
RepTor: An Intelligent Hybrid Neural Network Based Recipe Generator for Semiconductor Process Modeling and Characterization
Author :
Ahn, Jong Hwan ; Tae Yoon Kang ; Lim, Woo Yeop ; Han, Seungsoo ; Kim, Hack Man ; Sang Jeen Hong
Author_Institution :
Dept. of Electron. Eng., Myongji Univ., Yongin, South Korea
fYear :
2009
fDate :
June 30 2009-July 2 2009
Firstpage :
1118
Lastpage :
1123
Abstract :
An intelligent hybrid neural network based recipe generator is presented as a convenient tool for process optimization typically aiming highly-nonlinear plasma process in semiconductor manufacturing. As the wafer size continuously expanding up to 300 mm in current high-volume manufacturing (even forecasting 450 mm in 2012), fast and convenient process settlement cannot be over emphasized to meet the time-to-market of the newly developed products. In this paper, we suggest a recipe generator based on neural network and particle swamp optimization, nominally RepTor, to help minimizing material cost for process setup and maximizing accuracy of process modeling. RepTor is verified using SiO2 deposition process for modeling and predicting the wafer geometry in conjunction with tool parameter. We have convinced the capability of the suggested recipe generator, and it provides a good starting point for further fine tuning of process optimization.
Keywords :
electronic engineering computing; neural nets; particle swarm optimisation; production engineering computing; semiconductor industry; semiconductor process modelling; silicon compounds; RepTor; SiO2; deposition process; intelligent hybrid neural network; nonlinear plasma process; particle swamp optimization; process optimization; process setup; recipe generator; semiconductor manufacturing; semiconductor process modeling; wafer geometry; Character generation; Hybrid power systems; Intelligent networks; Manufacturing processes; Neural networks; Plasma materials processing; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor process modeling; Time to market; Hybrid Neural Network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
New Trends in Information and Service Science, 2009. NISS '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-3687-3
Type :
conf
DOI :
10.1109/NISS.2009.64
Filename :
5260411
Link To Document :
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