Title :
Leakage power reduction in low-voltage CMOS designs
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Lowering supply voltage is one of the most effective ways of reducing power dissipation. Low supply voltage requires the device threshold to be reduced in order to maintain performance. Due to the exponential relationship between the leakage current and the transistor threshold voltage in the weak inversion region, static current (and hence, static power power dissipation) can no longer be ignored. In this paper the author presents different design techniques such as multiple threshold voltage, dynamic threshold control, substrate biasing, and leakage control using transistor stacking to achieve large improvements in leakage power during both stand-by and active mode of operation
Keywords :
CMOS digital integrated circuits; integrated circuit design; leakage currents; low-power electronics; active mode; design techniques; device threshold reduction; dynamic threshold control; leakage control; leakage current; leakage power reduction; low-voltage CMOS designs; multiple threshold voltage; power dissipation reduction; stand-by mode; substrate biasing; transistor stacking; transistor threshold voltage; weak inversion region; Diodes; Dynamic voltage scaling; Leakage current; Low voltage; Power dissipation; Power engineering computing; Semiconductor device modeling; Silicon on insulator technology; Threshold voltage; Voltage control;
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
DOI :
10.1109/ICECS.1998.814856