DocumentCode :
3454591
Title :
Full-field imaging techniques for the molecular analysis of complex materials
Author :
Mackey, J.R. ; Salari, E.
fYear :
2001
fDate :
11-11 May 2001
Firstpage :
464
Abstract :
Summary form only given. We have demonstrated a non-invasive fall-field phase-modulated instrument for measuring material properties, fluid flow parameters, stress, strain and molecular structure of optically active materials. A fall-field measurement technique is absolutely necessary in order to obtain science information over an entire sample at one time. Quantitative stress and strain measurements can be obtained in this manner.
Keywords :
CCD image sensors; image processing; liquid crystal devices; mechanical birefringence; molecular configurations; molecular orientation; nondestructive testing; optical modulation; optical polarisers; optical rotation; strain measurement; stress measurement; CCD array; complex materials; fall-field measurement technique; fluid flow parameters; full-field imaging techniques; image analysis techniques; liquid crystal variable retardation plate; molecular analysis; molecular structure; noninvasive fall-field phase-modulated instrument; optically active materials; polarization state modulator; polarized light; science information; strain measurement; stress measurement; Fluid flow; Fluid flow measurement; Image analysis; Instruments; Material properties; Optical imaging; Optical materials; Phase measurement; Strain measurement; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
Type :
conf
DOI :
10.1109/CLEO.2001.948047
Filename :
948047
Link To Document :
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