DocumentCode :
3454621
Title :
Simulation of geometry and surface effects in short gate length MESFETs and HEMTs
Author :
Asenov, A. ; Babiker, S. ; Cameron, N. ; Beaumont, S.P.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
fYear :
1995
fDate :
35037
Firstpage :
42401
Lastpage :
42406
Abstract :
We summarise the features of the physical device simulators required for the design of new generation MESFETs and HEMTs. We also present the Glasgow simulation code H2F which meets most of these requirements. With the rapidly growing power of the single and multiple processor platforms the use of physical simulations including MC in the design process becomes not only necessary but feasible. We illustrate some of these points with steady-state and transient simulations
Keywords :
Schottky gate field effect transistors; digital simulation; electronic engineering computing; high electron mobility transistors; semiconductor device models; Glasgow simulation code; H2F; HEMT design; MC; MESFET design; geometry effects; physical device simulators; short gate length HEMTs; short gate length MESFETs; steady-state simulation; surface effects; transient simulation;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Terahertz Technology, IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19951484
Filename :
495120
Link To Document :
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