Title :
Measurement and modelling of monolithic IC´s from 30-100 GHz
Author :
Pearson, G.A. ; Lang, R.J.
Author_Institution :
Thomson-Thorn Missile Electron., Hayes, UK
Abstract :
This paper addresses the measurement and modelling of monolithic microstrip devices and circuits at frequencies from 30-100 GHz. The development of custom Line-Reflect-Line (LRL) on-wafer microstrip calibration standards to 100 GHz is discussed, and compared with off-wafer Coplanar Waveguide (CPW) standards. Examples of measurements to 40 GHz are discussed for monolithic diode and HEMT devices, along with examples of a variety of circuits operating at Ka-band and W-band, including in particular a W-band push-push oscillator
Keywords :
MIMIC; calibration; coplanar waveguides; integrated circuit modelling; integrated circuit testing; measurement standards; microstrip circuits; millimetre wave measurement; 30 to 100 GHz; EHF; Ka-band; LRL calibration standards; MIMIC; W-band; coplanar waveguide standards; line-reflect-line calibration standards; modelling; monolithic ICs; monolithic microstrip devices; offwafer CPW standards; onwafer microstrip calibration standards;
Conference_Titel :
Terahertz Technology, IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19951486
