Title :
Inelastic Electron Tunneling Spectroscopy of Molecular Magnetic Tunnel Junctions
Author :
Wang, Wenyong ; Richter, Curt A.
Author_Institution :
Semiconductor Electronics Division, National Institute of Standards and Technology, 100 Bureau Drive, M.S. 8120, Gaithersburg, MD 20899-8120. wenyong.wang@nist.gov
Keywords :
Electrical resistance measurement; Electrons; Gold; Magnetic field measurement; Magnetic tunneling; NIST; Scattering; Spectroscopy; Tunneling magnetoresistance; Vibration measurement;
Conference_Titel :
Device Research Conference, 2006 64th
Conference_Location :
State College, PA, USA
Print_ISBN :
0-7803-9748-7
DOI :
10.1109/DRC.2006.305074