• DocumentCode
    3454829
  • Title

    A low power cross-coupled charge pump with charge recycling scheme

  • Author

    Hwang, Hye-Won ; Chun, Jung-Hoon ; Kwon, Kee-Won

  • Author_Institution
    Dept. of Semicond. Syst. Eng., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2009
  • fDate
    6-8 Nov. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A low power charge pump that recycles the wasted charges is described. CMOS switched Dickson charge pump cannot accommodate charge recycling since charges are leaking from the boosted supply (VPP) back to the external supply (VDD) during the recycling period. Given power constraints, the proposed 2-stage cross-coupled pump with leak-back current suppression can provide the current 5 times higher than that of the conventional cross-coupled pump at VPP of 5 V. Its maximum achievable VPP is also 1.6 times higher. The test chip is under fabrication using 0.18 um CMOS technology.
  • Keywords
    CMOS analogue integrated circuits; charge pump circuits; 2-stage cross-coupled pump; CMOS Dickson pump circuits; NMOS diode; boosted supply; charge recycling scheme; external supply; leak-back current suppression; low power charge pump; size 0.18 mum; voltage 5 V; CMOS technology; Charge pumps; Circuits; Consumer electronics; Energy consumption; MOS devices; Power supplies; Read-write memory; Recycling; Switches; charge pump; charge recycle; energy scavenging; reverse current block;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals, Circuits and Systems (SCS), 2009 3rd International Conference on
  • Conference_Location
    Medenine
  • Print_ISBN
    978-1-4244-4397-0
  • Electronic_ISBN
    978-1-4244-4398-7
  • Type

    conf

  • DOI
    10.1109/ICSCS.2009.5412265
  • Filename
    5412265