DocumentCode :
3454873
Title :
Guerrilla tactics: motivating design patterns for high-dependability applications
Author :
Hugue, Michelle McElvany ; Purtilo, James
Author_Institution :
Dept. of Comput. Sci., Maryland Univ., MD, USA
fYear :
2002
fDate :
5-6 Dec. 2002
Firstpage :
33
Lastpage :
39
Abstract :
Hardware and software components are often treated as distinct entities with different development and run-time profiles. Yet, these key design elements and components of embedded and stand-alone computing systems have an inherent vulnerability to human error. Since manufacturers of hardware make extensive use of software in producing masses of integrated devices exhibiting independent failure rates, the rapidly growing software engineering community has begun to embrace the rule-and-tool based approach of the professional engineer. Adoption of iterative design rules, tools, component reuse, and simulation/testing methodologies into every process and component required by a complex systems for highly dependable applications has the potential to minimize the propagation of human-made latent errors into fielded systems. By identifying and employing design patterns for dependability, we believe that we can mitigate the effects of human agents as single points of failure and achieve the desired dependability of the final product.
Keywords :
application specific integrated circuits; object-oriented programming; program testing; software fault tolerance; software quality; software reusability; embedded computing systems; human-made latent errors; integrated devices; iterative design rules; rule-and-tool based approach; software component reuse; software design patterns; software testing; software tools; stand-alone computing systems; Application software; Computer errors; Computer science; Condition monitoring; Embedded computing; Fault tolerant systems; Hardware; Humans; Resilience; Runtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Workshop, 2002. Proceedings. 27th Annual NASA Goddard/IEEE
Print_ISBN :
0-7695-1855-9
Type :
conf
DOI :
10.1109/SEW.2002.1199447
Filename :
1199447
Link To Document :
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