Title :
Gatewaying IEEE 1149.1 and IEEE 1149.7 test access ports
Author :
Fernandes, Francisco R. ; Machado, Ricardo J S ; Ferreira, José M. ; Gericota, Manuel G.
Author_Institution :
Dept. of Electr. & Comput. Eng., FEUP, Porto, Portugal
Abstract :
In this paper, we present a description of our developed adapter, which takes acts as a gateway between IEEE 1149.1 and IEEE 1149.7 test infrastructures. The referred adapter reduces the pins of the TAP from 4 to 2 and implements advanced capabilities, such as Parking State of a TAPC and the Reset and Selection Unit (RSU).
Keywords :
IEEE standards; boundary scan testing; network servers; IEEE 1149.1 test access ports; IEEE 1149.7 test access ports; RSU; adapter; gateway; parking state; reset and selection unit; IEEE standards; Multiplexing; Pins; Protocols; Topology; Boundary-scan; IEEE Std 1149.1; IEEE Std 1149.7; TAP;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
DOI :
10.1109/IOLTS.2012.6313858
