• DocumentCode
    3455118
  • Title

    Improved Limits on Variation of the Fine Structure Constant and Violation of Local Position Invariance

  • Author

    Fortier, T.M. ; Ashby, N. ; Bergquist, J.C. ; Delaney, M.J. ; Diddams, S.A. ; Heavner, T.P. ; Hollberg, L. ; Itano, W.M. ; Jefferts, S.R. ; Kim, K. ; Oskay, W.H. ; Parker, T.E. ; Shirley, J. ; Stalnaker, J.E. ; Levi, F. ; Lorini, L.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    663
  • Lastpage
    665
  • Abstract
    We report tests of local position invariance (LPI) and constancy of fundamental constants from measurements of the frequency ratio of the 282-nm 199Hg+ optical clock transition to the ground-state hyperfine splitting in 133Cs. Analysis of the frequency ratio, extending over six years at NIST, is used to place a limit on the fractional variation of the two clocks of less than 5.8times10-6 per change in normalized solar gravitational potential, and a limit on fractional variation of the fine structure constant at alpha dot/alpha < 1.3x10-16 yr-1, assuming invariance of other fundamental constants. Comparison of our results with those previously reported for the absolute optical frequency measurements of coupled 171Yb+ versus other constraint 133Cs standard yields a coupled constraint of -0.04times10-15 < alpha dot/alpha < 0.46times10-15 yr-1 and -2.39times10-15 < d/dt In muCs/muB < 0.47times10-15 yr-1.
  • Keywords
    atomic clocks; fine structure constant; fractional variation; ground-state hyperfine splitting; local position invariance violation; optical clock transition; solar gravitational potential; Clocks; Frequency conversion; Frequency measurement; Measurement standards; Mercury (metals); NIST; Optical frequency conversion; Optical sensors; Position measurement; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
  • Conference_Location
    Geneva
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-0646-3
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2007.4319157
  • Filename
    4319157