DocumentCode

3455279

Title

Random Telegraph Noise in 130 nm n-MOS and p-MOS Transistors

Author

Yoon, Youngchang ; Lee, HoChul ; Kang, In Man ; Park, Byung-Gook ; Lee, Jong Duk ; Shin, Hyungcheol

Author_Institution

Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea. Tel : +82-2-880-7282, Fax : +82-2-882-4658, E-mail: y2chang@hanmail.net

fYear

2006

fDate

26-28 June 2006

Firstpage

283

Lastpage

284

Keywords

Capacitance; Charge carrier density; Equations; Fluctuations; Low-frequency noise; MOSFETs; Noise level; Scattering; Telegraphy; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Device Research Conference, 2006 64th

Conference_Location

State College, PA, USA

ISSN

1548-3770

Print_ISBN

0-7803-9748-7

Type

conf

DOI

10.1109/DRC.2006.305184

Filename

4097639