DocumentCode :
3455353
Title :
Measurement of Minority Carrier Diffusion Lengths in Semiconductor Nanowires
Author :
Allen, Jonathan E. ; Gu, Yi ; Romankiewicz, John P. ; Lensch, Jessica L. ; May, Steven J. ; Odom, Teri W. ; Wessels, Bruce W. ; Lauhon, Lincoln J.
Author_Institution :
Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, IL 60208
fYear :
2006
fDate :
26-28 June 2006
Firstpage :
289
Lastpage :
290
Keywords :
Chemical technology; Electric variables measurement; Length measurement; Materials science and technology; Nanowires; Optical microscopy; Photoconductivity; Schottky barriers; Space charge; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2006 64th
Conference_Location :
State College, PA, USA
ISSN :
1548-3770
Print_ISBN :
0-7803-9748-7
Type :
conf
DOI :
10.1109/DRC.2006.305186
Filename :
4097641
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3455353
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