DocumentCode :
3455444
Title :
Emission Profile Studies Of Crt Cathodes
Author :
Nakanishi, Hayao ; Tama, M. ; Kai, J.
fYear :
1997
fDate :
13-14 Feb. 1997
Firstpage :
53
Lastpage :
56
Keywords :
Aging; Apertures; Area measurement; Cathode ray tubes; Current measurement; Electron emission; Pressure measurement; Pulse measurements; Time measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Display, 1997., Proceedings of the Fourth Asian Symposium on
Conference_Location :
Hong Kong, China
Print_ISBN :
962-8273-01-9
Type :
conf
DOI :
10.1109/ASID.1997.631396
Filename :
631396
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3455444
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