Title :
An advanced electromagnetic eigenmode solver for vacuum electronics devices-CTLSS
Author :
Cooke, S.J. ; Levush, B. ; Mondelli, A.A. ; Petillo, J.J. ; Chernin, D.P. ; Kostas, C. ; Czarnaski, M. ; Nelson, E. ; Antonsen, T.M., Jr.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
The Cold-Test and Large-Signal Simulation code (CTLSS), a design tool for vacuum electronics devices, is presented. The prototype tool is a three-dimensional, frequency-domain cold-test code that operates on a rectangular structured grid. It uses a generalisation of the Jacobi-Davidson algorithm that has proven effective in solving for eigenmodes in problems having sharp-edged structures with materials having large dielectric constants and loss tangents as high as 100%. We present the CTLSS algorithm and code features that are useful for vacuum electronics design. Analysis of both closed cavities and periodic slow-wave structures are given. Tests indicate that the CTLSS algorithm can determine mode frequencies to well below 0.1% accuracy for all modes computed. A new formulation has been implemented to compute the complex axial wavenumber, kz, in a periodic waveguide, as the eigenvalue for a specified real frequency, and test results will be presented. This code is being extended to include an unstructured mesh for the conformal representation of structures using high order elements
Keywords :
accelerator cavities; eigenvalues and eigenfunctions; electrical engineering computing; CTLSS; Cold-Test and Large-Signal Simulation code; advanced electromagnetic eigenmode solver; closed cavities; complex axial wavenumber; conformal representation; dielectric constants; frequency-domain cold-test code; high order elements; loss tangents; mode frequencies; periodic slow-wave structures; sharp-edged structures; unstructured mesh; vacuum electronics devices; Algorithm design and analysis; Dielectric constant; Dielectric losses; Dielectric materials; Electromagnetic waveguides; Frequency; Jacobian matrices; Periodic structures; Prototypes; Testing;
Conference_Titel :
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5573-3
DOI :
10.1109/PAC.1999.795705