DocumentCode :
3455495
Title :
Direct Writing of High Frequency Surface Acoustic Wave Devices on Epitaxial Pb(Zr0.20Ti0.80)O3 Thin Layers using Focus Ion Beam Etching
Author :
Salut, R. ; Daniau, W. ; Ballandras, S. ; Gariglio, S. ; Triscone, G. ; Triscone, J.M.
Author_Institution :
Inst. FEMTO-ST, Besancon
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
737
Lastpage :
740
Abstract :
We propose an original alternative to lithographic techniques based on the focused ion beam etching technique to fabricate SAW devices by directly "writing" the electrode pattern in the metal overlay. We also explore the RF capabilities of epitaxial Pb(Zr0.20Ti0.80)O3 (PZT) thin films deposited onto SrTiO3 single crystal substrates. We found that guided waves can be efficiently excited and detected at frequencies ranging from 3 to 5 GHz. Theory/experiment assessment shows a good predictability of the wave characteristics.
Keywords :
epitaxial layers; focused ion beam technology; sputter etching; substrates; surface acoustic wave devices; PZT; SrTiO3; SrTiO3 single crystal substrate; epitaxial Pb(Zr0.20Ti0.80)O3 thin layer; focused ion beam etching technique; frequency 3 GHz to 5 GHz; high frequency surface acoustic wave devices; metal overlay; Acceleration; Acoustic waves; Etching; Frequency; Ion beams; Substrates; Surface acoustic wave devices; Surface acoustic waves; Testing; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location :
Geneva
ISSN :
1075-6787
Print_ISBN :
978-1-4244-0646-3
Electronic_ISBN :
1075-6787
Type :
conf
DOI :
10.1109/FREQ.2007.4319173
Filename :
4319173
Link To Document :
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