DocumentCode :
3455595
Title :
Preparation of textured LiNbO3 thin films by off-axis laser deposition and their characterization
Author :
Kaemmer, K. ; Franke, K. ; Holzapfe, B. ; Stephan, D. ; Weihnacht, M.
Author_Institution :
Inst. for Solid State & Mater. Res., Dresden, Germany
Volume :
1
fYear :
1996
fDate :
3-6 Nov 1996
Firstpage :
243
Abstract :
We report on the preparation of lithium niobate thin films on (01.2) and (0001) sapphire and LaAlO3 (01.2) single crystalline substrates using off-axis laser deposition. X-ray diffraction in Bragg-Brentano geometry and in a microdiffractometer with an area detector were used to characterize the crystallography, the texture and the lateral homogeneity of the films. We examined the film morphology with atomic force microscopy (AFM) and scanning electron microscopy (SEM). For the preparation of thin films, the deposition temperature, the deposition pressure and the oxygen-Ar ratio of background pressure were varied. The films grow textured and oriented on the substrates used. For thin films on LaAlO3 substrates we found only (01.2) reflections of film and substrate in the Bragg-Brentano diffractometer with its selective reflection recording. This suggests that the films are oriented grown and consist of a single LiNbO3 phase. Investigations with the microdiffractometer showed that there is also an amount of a LiNb3O8 textured phase in the films. Thin films deposited on sapphire substrates consist of different mixtures of the LiNbO3 phase and the LiNb3O8 phase depending on the oxygen-Ar ratio of ambient atmosphere. At an oxygen-Ar ratio of 1:4, the films consist mainly of oriented LiNbO3. The dielectric polarization and domain structure of the films were investigated by electric scanning force microscopy
Keywords :
X-ray diffraction; acoustic materials; atomic force microscopy; dielectric polarisation; electric domains; lithium compounds; piezoelectric thin films; pulsed laser deposition; scanning electron microscopy; surface acoustic wave devices; surface topography; texture; vapour phase epitaxial growth; (0001) sapphire substrate; (01.2) sapphire substrate; Al2O3; Bragg-Brentano geometry; LaAlO3; LaAlO3 (01.2) single crystalline substrate; LiNb3O8; LiNb3O8 textured phase; LiNbO3; O2-Ar ratio; SAW devices; X-ray diffraction; atomic force microscopy; crystallography; deposition pressure; deposition temperature; dielectric polarization; domain structure; electric scanning force microscopy; epitaxial growth; film morphology; lateral homogeneity; microdiffractometer; off-axis laser deposition; scanning electron microscopy; selective reflection recording; textured LiNbO3 thin films; Atomic force microscopy; Crystallization; Lithium niobate; Optical films; Optical reflection; Scanning electron microscopy; Sputtering; Substrates; X-ray diffraction; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
Conference_Location :
San Antonio, TX
ISSN :
1051-0117
Print_ISBN :
0-7803-3615-1
Type :
conf
DOI :
10.1109/ULTSYM.1996.583967
Filename :
583967
Link To Document :
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