Title :
Statistical Component Variability Effects on Oscillator Phase Noise Performance
Author :
Green, Patrick A.
Author_Institution :
Northrop Grumman Electron. Syst., Baltimore
fDate :
May 29 2007-June 1 2007
Abstract :
Component and circuit variations can cause oscillator phase noise degradation. Leveraging component statistical performance such as sustaining stage amplifier residual phase noise, gain variation, resonator Q´s, circuit insertion loss, and other component tolerances, a simple model can be produced with these input variables and provide an accurate representation of phase noise performance yields for a given specification or conversely provide a high production yield performance specification. Manufacturers of these components have measured data and/or statistical information regarding many of these parameters. If only measured data exists, there are software tools available that will create probability distributions of the measured data. This paper will describe a method on how statistical analysis can be applied to a simple oscillator structure.
Keywords :
oscillators; phase noise; statistical analysis; statistical distributions; high production yield performance specification; oscillator phase noise; oscillator structure; probability distribution; statistical analysis; statistical component variability; Circuits; Degradation; Input variables; Insertion loss; Oscillators; Performance gain; Performance loss; Phase noise; Production; Software measurement;
Conference_Titel :
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location :
Geneva
Print_ISBN :
978-1-4244-0646-3
Electronic_ISBN :
1075-6787
DOI :
10.1109/FREQ.2007.4319181