DocumentCode :
345579
Title :
Observing beam motion using infrared interferometry
Author :
Byrd, J.M. ; Martin, M. ; McKinney, W.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
495
Abstract :
Phase noise in the RF master oscillator driving synchrotron oscillations of the beam has been identified as one of the dominant sources of noise in the infrared beamline at the Advanced Light Source. We present measurements of the effect of the electron beam motion in a Fourier transform interferometer (FTIR) detector. This form of detector may be sensitive to very small beam motions
Keywords :
Fourier transforms; electromagnetic wave interferometry; electron accelerators; particle beam diagnostics; storage rings; ALS; Advanced Light Source; Fourier transform interferometer detector; RF master oscillator; electron beam motion; infrared beamline; infrared interferometry; synchrotron oscillations; Electron beams; Light sources; Motion detection; Motion measurement; Optical interferometry; Oscillators; Phase noise; Radio frequency; Radiofrequency identification; Synchrotrons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5573-3
Type :
conf
DOI :
10.1109/PAC.1999.795742
Filename :
795742
Link To Document :
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