A methodology and tool for predictive analysis of configuration bit criticality in SRAM-based FPGAS: Experimental results

Author

Ferron, J.B. ; Anghel, L. ; Leveugle, R. ; Bocquillon, A. ; Miller, F. ; Mantelet, G.

Author_Institution

TIMA Lab., UJF, Grenoble, France

fYear

2009

fDate

6-8 Nov. 2009

Firstpage

1

Lastpage

6

Abstract

The interest for SRAM based FPGAs has increased in the last few years in embedded systems, due to cost and reconfigurability motivations. Such systems may operate in harsh environments with for example ionizing radiations, and the application may require a high level of dependability. When the FPGAs are not developed on radiation-hardened technologies, using them in critical applications requires evaluating the consequences of modifications in their configuration. This paper summarizes an approach to evaluate at design time the criticality of the various bits in the configuration file of such a FPGA. Results are given on an Atmel component and comparisons are made with experimental results based on laser fault injections and proton ground tests.

Keywords

SRAM chips; field programmable gate arrays; Atmel component; FPGA; SRAM; configuration bit criticality; embedded systems; laser fault injections; predictive analysis; proton ground tests; Circuit faults; Circuits and systems; Costs; Fault tolerance; Field programmable gate arrays; Ionizing radiation; Protection; Random access memory; Single event upset; Space technology; SRAM-based FPGA; configuration error; criticality evaluation;

fLanguage

English

Publisher

ieee

Conference_Titel

Signals, Circuits and Systems (SCS), 2009 3rd International Conference on

Conference_Location

Medenine

Print_ISBN

978-1-4244-4397-0

Electronic_ISBN

978-1-4244-4398-7

Type

conf

DOI

10.1109/ICSCS.2009.5412330

Filename

5412330