Title :
Interfacial Effects On Characteristics Of A-si Tft
Author :
Zou, X. ; Webb, D.P. ; Chan, Y.C. ; Lam, Y.W. ; Xu, Zongben
Keywords :
Capacitance; Dielectrics; Fabrication; Insulation; Interface states; Performance analysis; Solid state circuits; Space charge; Thin film transistors; Voltage;
Conference_Titel :
Information Display, 1997., Proceedings of the Fourth Asian Symposium on
Conference_Location :
Hong Kong, China
Print_ISBN :
962-8273-01-9
DOI :
10.1109/ASID.1997.631401
