DocumentCode
3456189
Title
Probing mechanical, electrical and thermal properties of nanoscale materials using MEMS devices
Author
Alam, Mohammad Tawhidul ; Haque, Mohammad Ariful
Author_Institution
Mech. & Nucl. Eng., Pennsylvania State Univ., University Park, PA, USA
fYear
2013
fDate
16-20 June 2013
Firstpage
780
Lastpage
783
Abstract
While the current trend in nanoscale materials characterization is to investigate single domain (mechanical, electrical, thermal) properties, this study explore if the extremely small size also `couples´ these domains. However, even single domain studies are challenging at the nanoscale and the literature suggests the need for new multi-domain characterization techniques. In this paper, we present experimental design for performing nanoscale multi-physics characterizations. Demonstrative results on the role of mechanical strain on the thermal and electrical conductivity of metals, semiconductors and insulators are also presented.
Keywords
electrical conductivity; insulators; micromechanical devices; nanostructured materials; thermal conductivity; MEMS device; electrical conductivity; electrical property; insulator; mechanical strain property; metal; multidomain characterization technique; nanoscale material characterization; nanoscale multiphysics characterization; semiconductor; thermal conductivity; thermal property; Conductivity; Couplings; Materials; Nanoscale devices; Phonons; Strain; Thermal conductivity; MEMS; Nanoscale multi-physics; Thin films; phase transformation; thermal and electrical conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
Conference_Location
Barcelona
Type
conf
DOI
10.1109/Transducers.2013.6626882
Filename
6626882
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