• DocumentCode
    3456189
  • Title

    Probing mechanical, electrical and thermal properties of nanoscale materials using MEMS devices

  • Author

    Alam, Mohammad Tawhidul ; Haque, Mohammad Ariful

  • Author_Institution
    Mech. & Nucl. Eng., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    2013
  • fDate
    16-20 June 2013
  • Firstpage
    780
  • Lastpage
    783
  • Abstract
    While the current trend in nanoscale materials characterization is to investigate single domain (mechanical, electrical, thermal) properties, this study explore if the extremely small size also `couples´ these domains. However, even single domain studies are challenging at the nanoscale and the literature suggests the need for new multi-domain characterization techniques. In this paper, we present experimental design for performing nanoscale multi-physics characterizations. Demonstrative results on the role of mechanical strain on the thermal and electrical conductivity of metals, semiconductors and insulators are also presented.
  • Keywords
    electrical conductivity; insulators; micromechanical devices; nanostructured materials; thermal conductivity; MEMS device; electrical conductivity; electrical property; insulator; mechanical strain property; metal; multidomain characterization technique; nanoscale material characterization; nanoscale multiphysics characterization; semiconductor; thermal conductivity; thermal property; Conductivity; Couplings; Materials; Nanoscale devices; Phonons; Strain; Thermal conductivity; MEMS; Nanoscale multi-physics; Thin films; phase transformation; thermal and electrical conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
  • Conference_Location
    Barcelona
  • Type

    conf

  • DOI
    10.1109/Transducers.2013.6626882
  • Filename
    6626882