• DocumentCode
    345621
  • Title

    Temperature effects on strain gages used on aerospace nickel hydrogen batteries

  • Author

    Studyvin, Bill ; Doty, Rocky Lee ; Repplinger, Ron

  • Author_Institution
    Pittsburg State Univ., Pittsburg, KS, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    325
  • Lastpage
    328
  • Abstract
    One of the advantages of aerospace nickel hydrogen cells is the ability to determine the state of charge of the cells by measuring the internal cell pressure. The internal cell pressure is also proportional to the induced strain in the cell pressure vessel wall. A common technique is to use bonded foil strain gages in a Wheatstone bridge configuration to measure the induced strain. If bonded foil strain gages are used to measure the induced strain, several temperature induced errors result. This research focuses on the effects of temperature on the resistance associated with the strain gages, the ladder resistors and the copper connecting wires. Several computer models are used to compare the temperature effects on the Wheatstone bridge with the ideal Wheatstone bridge output
  • Keywords
    bridge instruments; hydrogen; nickel; pressure measurement; secondary cells; strain gauges; strain measurement; testing; Ni-H2; Ni-H2 batteries; Wheatstone bridge; aerospace nickel hydrogen batteries; bonded foil strain gages; cell pressure vessel wall; computer models; copper connecting wires; induced strain; induced strain measurement; internal cell pressure measurement; ladder resistors; state of charge determination; strain gages; temperature effects; temperature induced errors; Bonding; Bridge circuits; Capacitive sensors; Charge measurement; Current measurement; Electrical resistance measurement; Hydrogen; Nickel; Strain measurement; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Battery Conference on Applications and Advances, 1999. The Fourteenth Annual
  • Conference_Location
    Long Beach, CA
  • ISSN
    1089-8182
  • Print_ISBN
    0-7803-4967-9
  • Type

    conf

  • DOI
    10.1109/BCAA.1999.796012
  • Filename
    796012