DocumentCode :
3456633
Title :
Amorphous silicon position sensitive neutron detector
Author :
Mireshghi, A. ; Cho, G. ; Drewery, J. ; Jing, T. ; Kaplan, S.N. ; Perez-Mendez, V. ; Wildermuth, D.
Author_Institution :
Lawrence Berkeley Lab., California Univ., CA, USA
fYear :
1991
fDate :
2-9 Nov. 1991
Firstpage :
51
Abstract :
An investigation of the possibility of using a-Si:H diode coated with an appropriate converter as a position-sensitive neutron detector is presented. Monte Carlo simulation predicts that, using a Gd film approximately 2- mu m thick, coated on a sufficiently thick amorphous silicon n-i-p diode, one can achieve a neutron detection efficiency of 25%. The experimental results presented give an average signal size of about 12000 e/sup -/ per neutron interaction, which is well above the noise and is in good agreement with the expected values. One can also fabricate pixel detectors with an element size as small as 300 mu m and still register a count rate of 2200 events/sec in a typical neutron flux of about 10/sup 7/ n/cm/sup 2/ per second. The fact that these detectors are not sensitive to gamma rays and show excellent radiation hardness makes them good candidates for use in applications such as neutron imaging, neutron crystallography, and neutron scattering.<>
Keywords :
Monte Carlo methods; amorphous semiconductors; neutron detection and measurement; position sensitive particle detectors; semiconductor counters; 2 micron; 300 micron; Gd film; Gd-Si:H; Monte Carlo simulation; a-Si:H diode; amorphous Si; neutron crystallography; neutron detection efficiency; neutron imaging; neutron scattering; pixel detectors; position sensitive neutron detector; radiation hardness; Amorphous silicon; Diodes; Event detection; Gamma ray detection; Gamma ray detectors; Gamma rays; Neutrons; Position sensitive particle detectors; Radiation detectors; Semiconductor films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
Type :
conf
DOI :
10.1109/NSSMIC.1991.258922
Filename :
258922
Link To Document :
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