• DocumentCode
    3456651
  • Title

    A simple analytical switching loss model for buck voltage regulators

  • Author

    Eberle, Wilson ; Zhang, Zhiliang ; Liu, Yan-Fei ; Sen, P.C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Queen´´s Univ., Kingston, ON
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    36
  • Lastpage
    42
  • Abstract
    In this paper, a simple and accurate analytical switching loss model is proposed for high frequency synchronous buck voltage regulators. The proposed model uses simple equations to calculate the rise and fall times and uses piecewise linear approximations of the high side MOSFET voltage and current waveforms to allow quick and accurate calculation of switching loss in a synchronous buck voltage regulator. Effects of the common source inductance and other circuit parasitic inductances are included. Spice simulations are used to demonstrate the accuracy of the voltage source driver model operating in a 1 MHz synchronous buck voltage regulator at 12 V input, 1.3 V output. Switching loss was estimated with the proposed model and measured with Spice for load current ranging from 10-30 A, common source inductance ranging from 250-1000 pH, voltage driver supply ranging from 6-12 V.
  • Keywords
    MOSFET; linear algebra; switching convertors; voltage regulators; waveform analysis; MOSFET current waveforms; MOSFET voltage waveforms; analytical switching loss model; buck voltage regulators; current 10 A to 30 A; linear approximations; voltage 6 V to 12 V; voltage source driver model; Analytical models; Circuit simulation; Equations; Frequency; Inductance; MOSFET circuits; Piecewise linear approximation; Regulators; Switching loss; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522697
  • Filename
    4522697