Title :
A direct comparison of Ge and Si(Li) detectors in the 2-20 keV range
Author :
Rossington, C.S. ; Giauque, R.D. ; Jaklevic, J.M.
Author_Institution :
Lawrence Berkeley Lab., California Univ., CA, USA
Abstract :
The spectral response of high-purity Ge and lithium-drifted Si (Si(Li)) surface barrier detectors of similar geometry has been measured over a range of X-ray energies under identical experimental conditions. Detector characteristics such as spectral background, escape peak intensity, entrance window absorption, and energy resolution are presented and compared. The authors attempt to consolidate the information on these characteristics by making comparisons under equivalent experimental conditions for the two types of detectors. A primary goal of the study is a comparison of the two types of detectors for use in X-ray fluorescence applications.<>
Keywords :
X-ray detection and measurement; semiconductor counters; 2 to 20 keV; Ge detectors; Si(Li) detectors; Si:Li; X-ray; X-ray fluorescence applications; energy resolution; entrance window absorption; escape peak intensity; high-purity; spectral background; spectral response; surface barrier detectors; Collimators; Electromagnetic wave absorption; Energy measurement; Energy resolution; Face detection; Fluorescence; Geometry; Laboratories; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
DOI :
10.1109/NSSMIC.1991.258926
