Title :
On a model of disastrous failures in oscillator microwave diodes
Author :
Prima, N.A. ; Soloviev, E.A.
Author_Institution :
Inst. of Semicond. Phys., Acad. of Sci., Kiev, Ukraine
Abstract :
We present the results of our investigations, both theoretical and experimental, of a possible mechanism of IMPATT diode failures. The mechanism is related to local nonuniformities of the temperature distribution over the active area.
Keywords :
IMPATT oscillators; failure analysis; microwave diodes; microwave oscillators; semiconductor device models; semiconductor device reliability; temperature distribution; IMPATT diode failures; active area; local nonuniformities; oscillator microwave diodes; temperature distribution; Conductivity; Electromagnetic heating; Equations; IEEE catalog; Microwave oscillators; Organizing; Physics; Semiconductor diodes; Temperature dependence; Temperature distribution;
Conference_Titel :
Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-572-003-1
DOI :
10.1109/CRMICO.1999.815154
