Title :
Stable ruthenium-contact relay technology for low-power logic
Author :
I-Ru Chen ; Yenhao Chen ; Hutin, Louis ; Pott, Vincent ; Nathanael, Rhesa ; Liu, T.-J King
Author_Institution :
Univ. of California, Berkeley, Berkeley, CA, USA
Abstract :
Micro-electro-mechanical relays are of interest for low-power digital integrated circuits, due to their ideally zero OFF-state leakage current. The first relay-based integrated circuits utilized tungsten (W) as the contacting material because of its excellent resistance to physical wear. However, W oxidizes easily so that the contact resistance increases to an unacceptably high level over the device operating lifetime. Ruthenium (Ru) is a promising alternative contacting electrode material because it forms an electrically conductive native oxide. In this work, challenges and solutions for integrating Ru into a relay fabrication process are described. Ru-contact relays with good switching behavior and more stable ON-state resistance than W-contact relays are demonstrated.
Keywords :
contact resistance; integrated logic circuits; leakage currents; low-power electronics; microelectrodes; microfabrication; microrelays; ON-state resistance; contact electrode material; contact resistance; device operating lifetime; electrically conductive native oxide; low power digital integrated circuits; low power logic; microelectromechanical relay; relay based integrated circuit; relay fabrication process; switching behavior; zero OFF-state leakage current; Aluminum oxide; Contacts; Electrodes; Materials; Relays; Surface resistance; Switches; Micro-electro-mechanical relay; contact resistance; reliability; ruthenium;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
Conference_Location :
Barcelona
DOI :
10.1109/Transducers.2013.6626912